Analysis of the passive layer developed on stainless steels implanted with chromium

Authors

  • C. Mª Abreu ET.S.I.I., Universidad de Vigo
  • J. Cristóbal ET.S.I.I., Universidad de Vigo
  • X. R. Nóvoa ET.S.I.I., Universidad de Vigo
  • G. Pena ET.S.I.I., Universidad de Vigo
  • Mª C. Pérez ET.S.I.I., Universidad de Vigo

DOI:

https://doi.org/10.3989/revmetalm.2004.v40.i3.269

Keywords:

Ion implantation, stainless steels, XPS, cyclic voltammetry

Abstract


This work studies the effect of chromium implantation on the development of passive layers generated electrochemically in alkaline medium over two stainless steels. The XPS analyses show that the layers generated on the implanted steels present less thickness together with similar composition compared to the unimplanted steels layers. However, SEM micrographs show that the layers grown on implanted steels present more defects and less adherence that the films on unimplanted steels. These changes together with the results obtained by Cyclic Voltammetry suggest an oxide structure modification, lattice structure or cristalinity state.

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Published

2004-06-30

How to Cite

Abreu, C. M., Cristóbal, J., Nóvoa, X. R., Pena, G., & Pérez, M. C. (2004). Analysis of the passive layer developed on stainless steels implanted with chromium. Revista De Metalurgia, 40(3), 224–229. https://doi.org/10.3989/revmetalm.2004.v40.i3.269

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Articles