X-ray diffraction line profile analysis of Cu –2 wt. % Cr –6 wt. % Mo alloy mechanically alloyed


  • C. Aguilar Instituto de Materiales y Procesos Trmomecánicos, Facultad de Ciencias de la Ingeniería, Universidad Austral de Chile
  • V. Martínez Tekmetall, Metalurgical Solutions, S.L., San Sebastián
  • S. Ordóñez Tekmetall, Metalurgical Solutions, S.L., San Sebastián
  • O. Pávez Departamento de Metalurgia. Universidad de Atacama
  • L. Valderrama Departamento de Metalurgia. Universidad de Atacama




Mechanical alloying, XRD, Crystallite size, Stacking fault, Cu-Cr-Mo


By X-ray diffraction line profile analysis it is possible to obtain valid information of structure and properties of materials. This method is a powerful tool for nanomaterials microstructure characterization. In the present work mechanical alloying of ternary system Cu -2 wt. % Cr -6 wt. % Mo was made between 0.25 and 4 h of milling. By means of modified Warren-Averbach and Williamson-Hall methods the crystallite size, dislocation density, microstrain and average distance between dislocations were estimated. The crystallite size values were corrected by stacking fault presence. It was demonstrated that powders have a high anisotropic strain, which was corrected using the average dislocation contrast factors for fcc structures. Also the influence of milling time and percentage of solute on stacking fault probability and stacking fault energy was determined.


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How to Cite

Aguilar, C., Martínez, V., Ordóñez, S., Pávez, O., & Valderrama, L. (2008). X-ray diffraction line profile analysis of Cu –2 wt. % Cr –6 wt. % Mo alloy mechanically alloyed. Revista De Metalurgia, 44(3), 243–250. https://doi.org/10.3989/revmetalm.2008.v44.i3.112




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